BRAINY MOTE- AN AREA EFFICIENT SMART SENSOR

The new technology is the INTERNET OF THINGS, the general concept of the Internet of Things is that we can put a sensor on anything and have it send data back to a database through the Internet. In this way we can monitor everything, everywhere and build smarter systems that are more interactive than ever before. Now what if the sensors were in the air, everywhere? They could monitor everything temperature, humidity, chemical signatures, movement everything. The technology is called Brainy mote or Smart Dust. Smart dust is tiny electronic devices designed to capture mountains of information about their surroundings while literally floating on air like dust. Smart Dust is a self-contained network of tiny motes each having the capability of sensing and monitoring the environment conditions. Smart Dust is made of “motes” which are tiny sensors that can perform a variety of functions. They are made of “micro electro mechanical systems” known as MEMS

An On-Chip Delay Measurement Technique for Small-Delay Defect Detection using Signature Registers

This paper presents a delay measurement technique using signature analysis, and a scan design for the proposed delay measurement technique to detect small-delay defects. The proposed measurement technique measures the delay of the explicitly sensitized paths with the resolution of the on-chip variable clock Generator. The proposed scan design realizes complete on-chip delay measurement in short measurement time using the proposed delay measurement technique and extra latches for storing the test vectors. The evaluation with Rohm 0.18- m process shows that the measurement time is 67.8% reduced compared with that of the delay measurement with standard scan design on average. The area overhead is 23.4% larger than that of the delay measurement architecture using standard scan design, and the difference of the area overhead between enhanced scan design and the proposed method is 7.4% on average. The data volume is 2.2 times of that of test set for normal testing on average